Data Processing

SIF users acquire an abundance of high-resolution images and high quality data at our facility daily. Equally important to the acquisition of this complex data is the time spent processing and understanding the results. We provide users access to a broad range of post-processing software packages for image and data analysis.

Image processing and analysis is available for both Fluorescence and Electron Microscopy imaging.

  • The Leica Application Suite X (LAS X) provides fluorescence imaging performed on either the Leica DM6B upright microscope or the Leica SP8 confocal microscope.
  • Our Zeiss SteREO Lumar V.12 inverted fluorescence microscope uses the Zeiss Zen Pro software platform for imaging and image processing. 

Our Electron Microscopy capabilities span from high-resolution (Scanning) Transmission Electron Microscopy (S/TEM) with the Thermofisher Spectra 300 to biological and soft material TEM on the JEOL 1400.

  • Both use the Gatan DigitalMicrograph software for image and spectrum analysis.
  • In addition "no cost" software packages such as Microsoft "Image Composite Editor" (ICE) and National Institute of Health (NIH) "ImageJ" provide imaging montage and analysis.

Characterization data comes in many formats and likewise requires specific types of analytical packages.

  • Bulk-material structural analysis performed on our PANalytical X-ray Diffractometer (XRD) utilizes the HighScore Plus software coupled with the database suite PDF-4+ from the International Centre for Diffraction Data (ICDD). This instrument also has additional software packages for Texture, Reflectivity, Epitaxy, 2D Scan, and Small Angle X-ray (SAXS) analyses - all of these software packages are available on the instrument computer as well as a post-processing station.
  • Electron backscattered diffraction (EBSD) is a site-specific in-situ structural analysis technique performed on our ThermoScientific Helios G5 CXe Plasma FIB/SEM. The EBSD system coupled to our FIB is an Oxford Instruments Symmetry® detector. The Energy Dispersive X-ray Spectrometer (EDS) is an Oxford Instruments Ultim®Max system. Both use the AZtec sotware suite.
  • EDAX TEAM Pegasus system integrated for Energy Dispersive Spectroscopy (EDS) to acquire compositional information; additional data processing software is available on a post-processing station.
  • X-ray Photoelectron Spectroscopy (XPS) on our Scienta Omicron ESCA 2SR XPS allows near-surface chemical characterization. Our facility provides all LSU users access to CasaXPS software for post-processing their analysis, through our LSU site-license (please contact us for license information).

DELL data processing workstationData processing workstation